Micran presented the developments on XIV International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices.

Micran was represented in "Radio and telecommunication. Microwave Technology" section by by Nikolay Voronin with "Measurement Systems for the Analysis of Distortions Caused by the Passage Band Signals through Nonlinear Devices" and Andrey Zagorodny who spoke about "Modeling and Application of Microwave Detector Diodes" ( pdf 1,13 Mb) and was awarded the first class degree by the international jury.

The conference was held in partnership with Novosibirsk State Technical University (NSTU), Russian Foundation for Basic Research (RFBR) and Institute of Electrical and Electronics Engineers (IEEE).